Glossary of Die Bond.docx

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GlossaryofDieBond

GlossaryDB/DA

ABCDEFGHIJKLMNOPQRSTUVWXYZ

A

top

Assist

Anyunplannedinterruptionorvariancefromspecificationsofequipmentoperationthatrequireshumaninterventionoffewerthansixminutestocorrect.Aftersixminuteshaselapsed,anassistbecomesafailure.Ifinterventionisrequired,butthereisnointerruptionofoperationwithinspecificationsandnocomponentisreplaced,theactionisdeemedtobeanassistindependentofitsduration.

B

top

Ballbonding

Athermosonicbondingtechnique.Thewireendismeltedtoformaball,whichprovidesalargerareaofcontactthanotherwisepossible.

Ballbumpbonding

Ballbumpbondingplacesagoldballbumponanactivecircuitpriortobondingthewedgebondoftheassociatedinterconnectingwire.Usedforstackeddie,reversebondingandmulti-chipscalepackages.

BallGridArray(BGA)

Typeofchippackage.Anintegratedcircuitsurface-mountpackagewithanareaarrayofsolderballsthatareattachedtothebottomsideofasubstratewithroutinglayers.

BehaviorBasedEquipmentModel(B-BEM)

Softwarearchitecturethatrepresentsequipmentbasedonitsbehavior.

Bonddeformation

Thechangeintheformoftheleadproducedbythebondingtool,causingplastictoflowinmakingthebond.

Bondforce

Verticalforceonthebondingtool(capillary)duringthebondingcycle.

BondLineThickness(BLT)

Determinestheaveragethicknessofthebondingmaterial(epoxy,solder).

Bondpad

Ametallizedregiononthetopsurfaceofsemiconductordieviawhichelectricalconnectiontoanexternalcircuitismadebymeansofabondwire.

Bondrange

Theusableareaofaleadframeorsubstrateforbonding.

BondVisionModule(BVI)

Diebonderopticalandelectronicmechanismforcontrollingpositionandorientationofachipinbondingposition.

Bondhead(BHD)

Thewirebonderdevicethatperformsallmovementsandoperationsnecessarytobondthewiretothebondpads.

Bumpchip

Achipthathasonitsterminationpadsabumpofsolderorotherbondingmaterialthatisusedtobondthechiptoexternalcontacts.

C

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Calibration(CALIB)

Setting-upamachinetoaknownreferencecondition

Capabilities(CAP)

Capabilitiesareoperationsperformedbytheequipment.TheseoperationsareinitiatedthroughthecommunicationsinterfaceusingsequencesofSECS-IImessages(orscenarios).

Capillary(HDH)

Ahollowbondingtoolusedtoguidethebondingwireandtoapplyforcetothewireduringthebondingcycle.

Carrier(FAB)

Holdsthestrips(leadframes)forthetransfers.

Cassette

Carrierforwafers,mountedonwaferframes.

Cell

ClusterofmachinesunderthecontrolofaCellController.

Changeover

Changeofproductiontools(e.g.downholders,clamps,etc.).

Chip

SeeDie

ChiponBoard(COB)

Ahybridtechnologythatexclusivelyemploysface-up-bondedchipdevicesinterconnectedtothesubstrateinaconventionalmanner,i.e.,byflyingwires.AgenerictermformountinganunpackagedsilicondiedirectlyontothePCB.

ChipScalePackaging(CSP)

Small-footprintintegratedcircuitpackages,sometimesdefinedas1.2timesthediesize;moreappropriatelyreferstoarraypackagesnearlythesamesizeasthechipstheycontain.

COB

SeeChiponBoard

CompressedDryAir(CDA)

Alsoreferredtoascleandryair.

Consumable

Materialforone-timeuse,e.g.goldwire,epoxy.

ControlledCollapseChipConnection(C4)

Themostcommonexampleofsolder-bump-basedflipchiptechnology.

CostOfOwnership(COO)

Thetotallifetimecostsassociatedwithacquisition,installation,andoperationofproductionequipment.

Cp

SeeProcessCapability

Cpk

Seeprocesscapabilityindex

CSP

SeeChipScalePackaging

Curing(CU)

Processstepforthehardeningofepoxy.

D

top

Die

Asmallpieceofsiliconthatcontainsthecompletedevicebeingmanufactured.Alsocalledchipormicrochip.

DieAttach(DA)

DieBonder

DieBonder(DB)

Picks,placesandbondschipsontostrips,substratesorleadframes,sometimesreferredtoasdieattach.

Discrete

Adeviceorcomponentthathasasinglefunction,suchasadiodeortransistor.

Downholder/heaterassembly

Clampsandheatstheleadframeduringbonding.

Downtime(DT)

Thetimeduringwhichequipmentisnotinacondition,orisnotavailable,toperformitsintendedfunction.Thisdoesnotincludeanyportionofnon-scheduledtime.

DualWireDispenser(DWD)

Moduleonasoftsolderdiebonder;awiredispenserthatcandispensetwowiressimultaneously.

E

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EpoxyProcess

Processesforattachingadietoastrip,substrateorleadframethroughuseofepoxyglue.

EutecticProcess

Oneofthevariousprocessesforattachingadietoaleadframeusinganalloywithaminimizedmeltingpoint.

F

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Failure

Anyunplannedinterruptionorvariancefromthespecificationsofequipmentoperationotherthananassist

FiberOpticLink(FOL)

Fiberopticconnection.

FlipChip

Flipchipinterconnecttechnologypertainstothemountingofachipwithitsactivesidefacingthesubstrate.

FlipChipinPackage(FCIP)

Canbeasinglechippackageormultichipmodule.

FlipChiponBoard(FCOB)

Baresinglechipormultiplechipsmixedwithothercomponentsonaboard.

Freeairball

Ballformationpriortobondingcontact

G

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GenericEquipmentModel(GEM)

GenericModelforcommunicationandcontrolofSEMIequipment.Definesthebehaviorofsemiconductorequipmentasviewedthroughacommunicationslink,e.g.SECS-II;providesthedefinitionofmessagesanddataitemsexchangedbetweenthehostandtheequipment.GEMdefineswhichSECS-IImessagesshouldbeused.

GraphicalUserInterface(GUI)

Human/machineinterface(HMI).

H

top

HotLot

Lotwithhighestprioritythatwillbeprocessednext.

I

top

Idle

Equipmentwaitinginareadystate.

Integratedcircuit(IC)

Chip,device.

IntegratedQualityControl(IQC)

Diebonderonboardinspectionsystemforcheckingquality,e.g.chipplacement,leadframefingers,etc.

Interconnection

Theconductivepathrequiredtoachieveelectricalconnectionbetweenacircuitelementandtherestofthecircuit.

L

top

LeadOnChip(LOC)

Thedeviceisfixedwithatapeunderneaththesubstrate;nocuringneeded.

Leadwires

Wireconductorsusedforintra-connectionsorinput/outputleads.

Leadframe(L/F)

Sheetmetalframeworkuponwhichanintegratedcircuitisattached.

LeadframeHandler(LH)

Automaticallyloadsandtransportsleadframesduringthediebondingprocess.

LOC

SeeLeadOnChip

Local

Acommunicationstateoftheequipmentduringwhichtheequipmentiscontrolledbytheoperator,notbytheCC.

Loop–wirebond

Thecurveorarcofthewirebetweentheattachmentpointsateachendofawirebond.

Lot

Productionunit,collectionofcarriersorabatchofwafersprocessedatthesametime.

M

top

MachineConfiguration(M/C)

Mostlyusedasanabbreviationfor“machine”.

Magazine

Carrierforstrips,substratesorleadframes.

MagazineHandler(MH)

Partofdiebonderorwirebonderforinputoroutputhandlingofmagazines.

Maintenance(MAG)

Ensuringthatequipmentiskeptinaconditionthatallowsittoperformitsintendedfunction.

MasterUnit(MU)

Thediebondermasterunitcontrolsallthemodules.

MCM

SeeMultichipModule

MeanTimeBetweenAssist(MTBA)

Theaveragetimeduringwhichtheequipmentperformeditsintendedfunctionbetweenassists;productivetimedividedbythenumberofassistsduringthattime.Seeassist

MeanTimeBetweenFailure(MTBF)

Theaveragetimeduringwhichtheequipmentperformeditsintendedfunctionbetweenfailures;productivetimedividedbythenumberoffailuresduringthattime.SeeFailure

MeanTimeToRepair(MTTR)

Theaveragetimerequiredtocorrectafailureandtoreturntheequipmenttoaconditioninwhichitcanperformitsintendedfunction.Thesumofallrepairtimeincurredduringaspecifiedperiod(includingequipmentandprocesstesttime,butexcludingmaintenancedelay)dividedbythenumberoffailuresduringthatperiod.

Metallization

Afilmpatternofconductivematerialdepositedonasubstratetointerconnectelectroniccomponents,orthemetalfilmonthebondingareaofasubstratethatbecomesapartofthebondandperformsbothanelectricalandamechanicalfunction.

MicroElectromechanicalSystems(MEMS)

Atechnologythatcombinescomputerswithtinymechanicaldevicessuchassensors,valves,gears,mirrorsandactuatorsembeddedinsemiconductorchips.

Micron(µm)

Unitoflengthequaltoonemillionthofameter.Conversion:

25.4micronsequals0.0254mm=0.001”=1mil=1,000microinches.

Mil

One-thousandthofaninch.Equalto25.4microns.

Mold

Third-partyequipmentusedtoencapsulatesemiconductordevicesontheleadframewithathermosettingplastic.

MultichipModule(MCM)

Apackagingapproachbasedontheinterconnectionofmultiplebaredieonasinglesubstrate.

MultichipPackage(MCP)

AnMCPcontainsafewbarechipsperpackage,andtheycanbearrangedeitherside-by-sideorstackedontopofeachother.MCPstypicallydonotincludediscreteorpassivecomponents.

O

top

Offlineprogramming(OLP)

SoftwarethatenablestheteachingofcompleteorpartialwirebonderrecipesonaseparatePC.

OpticalBondCentering(OBC)

Visionsystemforcontrollingthepositionandorientationofthechipinbondingposition.OBCisusedasameansofqualityinspectionaswell.

P

top

Package

Containerforadiethatprovidesprotectionandconnectiontothenexthigherlevelofintegration.

Passivation

Theformationofaninsulatinglayerdirectlyoveracircuitorcircuitelementtoprotectthesurfacefromcontaminants,moistureorparticles.

Patternrecognitionsystem(PRS)

Advancedalignmentsystembasedonobject-orientedprocessing.Employsgeometri

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