7N372Word文件下载.docx

7N372Word文件下载.docx

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Approved

Date

A00-00

InitialRelease

2

SCOPE

ThisdocumentoutlinestherequirementsnecessaryforqualificationofaLowPower（<

2A）SignalConnectorSetconsistingofmatchingPlugsandReceptacles.

3APPLICABLEDOCUMENTS

CONNECTORPARTSPECIFICATION

EIA-364-1000.01ELECTRONICSINDUSTRIESASSOCIATION“ELECTRICALCONNECTORTESTPROCEDURE

4EXCEPTIONS/ADDITIONS

4.1TherequirementscontainedwithinthisdocumentaregeneralrequirementsthatapplytoSurfaceMountPlugandReceptaclequalificationsunlessotherwisestatedinthespecificconnectorpiecepartspecification.

4.2Dellreservestherighttolistadditionalqualificationrequirementsonthecomponentspecification.Ifconflictexistsbetweenthecontentofthisdocumentandthatofthecomponentspecification,thelatterwillapply.

4.3Dellreservestherighttomeasureplatingthicknessattheirdiscretiontoassurecompliancetoconditionswhichqualificationwasgranted.

4.4AnindependentthirdpartytestlaboratorythathasbeenapprovedbyDellshallperformalltesting,unlessotherwisespecifiedbyDellComputerCorporation.

5QUALIFICATIONREQUIREMENTS

5.1QualificationSamplesandDataRequirements

5.1.1Qualificationsampleswillnotbeshippedasproductionmaterial.

5.1.2Qualificationsamplesmustbeaccompaniedbyplatingthicknessdata,takenonrepresentativepartsfromthesamelot.

5.1.3QualificationtestresultsandconnectorinformationmustbesubmittedusingthespreadsheetprovidedbyDelloraspreadsheetthathasreceivedDellapproval.

5.1.4Intheeventofafailure,thelaboratoryofchoicemustnotifyDellofthefailurepriortonotifyingthesupplier.Thesupplierwillthenprovideafailureanalysis/correctiveactionreportandperformaretesttodemonstrateresolutionoftheproblem.

5.2QualificationProcedure

5.2.1EachconnectorwillhaveaDellspecificationassociatedwithit.TheDellConnectorspecificationsoverridethisdocument.

5.2.2ThetestmatrixcalledoutintheDellConnectorspecificationsshouldbefollowed.Ifthereisnomatrixprovidedinthatdocument,therecommendedtestmatrixinsection5.2.5maybeused.

5.2.3ConnectorDefinitions

5.2.3.1Type1–Internal

5.2.3.2Type2–ExternalI/O

5.2.4Resultsshouldbereportedusingtheattachedstandardreportformat.

5.2.5RecommendedTestMatrix（onlytobeusedifnotestmatrixisprovidedintheDellConnectorSpecificationforthatpart）

Type1

Type2

TestFlowA

HighTempLife

TestFlowB

CyclicTempandHumidity

X

TestFlowC

Vibration

TestFlowD

MixedFlowingGas

TestFlowE

ThermalCycling

TestFlowF

Dust

TestFlowG

CyclicMixedFlowingGas

5.3QualificationTestFlows

5.3.1TESTFLOWA–HighTemperatureLife.

5.3.2TESTFLOWB–CyclicTemperatureandHumidity.

5.3.3TESTFLOWC–Vibration.

5.3.4TESTFLOWD–MixedFlowingGas.

5.3.5TESTFLOWE–ThermalCycling.

5.3.6TESTFLOWF-Dust.

5.3.7TESTFLOWG–CyclicMixedFlowingGas.

5.4QualificationTests

5.4.1Low-levelContactResistanceEIA-364-23

5.4.1.1TheintentofthistestisencompassedinthelatestversionofEIA-364-23.

5.4.1.2Thetestspecimensshallbematedduringthetest.

5.4.1.3SampleSize–Dependentuponcurrenttestgroup,refertosection5.2forspecificsamplesizes.

5.4.1.4FailureCriteria-Nochangegreaterthan+10.0mΩ.

5.4.2Durability（preconditioning）EIA-364-09

5.4.2.1TheintentofthistestisencompassedinlatestversionofEIA-364-09.

5.4.2.2Numberofcycles.

#ofcycles

#ofcycleoverthelifeoftheconnectorpair

*

1-5

5

6-25

20

26-200

50

200+

*ConsultwithDelltodetermineappropriatecyclesdependingonapplication.

5.4.2.3SampleSize–Dependentuponcurrenttestgroup,refertosection5.2forspecificsamplesizes.

5.4.2.4Connectorstobeinspectedfordamageevery10cycles.

5.4.2.5FailureCriteria–Noevidenceofphysicaldamage.

5.4.2.6Nolubricationtobeusedduringcycling.

5.4.2.7Cyclingtobeperformedmanuallyunlessotherwisespecified.

5.4.2.8Cyclingrate-500cyclesperhour

5.4.3TemperatureLifeEIA-364-17Table8

5.4.3.1TheintentofthistestisencompassedinthelatestversionofEIA-364-17.

5.4.3.2Temperature–105C

5.4.3.3SampleSize–Dependentuponcurrenttestgroup,refertosection5.2forspecificsamplesizes.

5.4.3.4Duration–300Hrs.

5.4.4Reseating

5.4.4.1Theconnectorpairneedstoundergo3manualplug/unplugcycles.

5.4.4.2SampleSize–Dependentuponcurrenttestgroup,refertosection5.2forspecificsamplesizes.

5.4.4.3FailureCriteria-Noevidenceofphysicaldamage.

5.4.4.4Nolubricationtobeusedduringcycling.

5.4.5ThermalShockEIA-364-32

5.4.5.1TheintentofthistestisencompassedinthelatestversionofEIA-364-32.

5.4.5.2Thetestspecimensshallbematedduringthetest.

5.4.5.3SampleSize–Dependentuponcurrenttestgroup,refertosection5.2forspecificsamplesizes.

5.4.5.4Temperaturerange–55Cto+85C

5.4.5.530minutedwellateachtemperatureextreme

5.4.5.6Testingcycles–10

5.4.6CyclicTemperature&

HumidityEIA-364-31

5.4.6.1TheintentofthistestisencompassedinthelatestversionofEIA-364-31.

5.4.6.2Thetestspecimensshallbematedduringthetest.

5.4.6.3SampleSize–refertosection5.2forspecificsamplesizes.

5.4.6.4Humidity–90%-95%

5.4.6.5TemperatureRange–25Cto65C

5.4.6.6Duration–60cycles.（480hours）

5.4.6.7CycleDefinition–Eachcycleshouldlast8hours.Thecycleisa2hourdwellatthelowtemperature,a2hourrampfromthelowtemperaturetothehightemperature,a2hourdwellatthehightemperature,anda2hourrampfromthehightemperaturetothelowtemperature.

5.4.7TemperatureLife（preconditioning）EIA-364-17Table9

5.4.7.1TheintentofthistestisencompassedinthelatestversionofEIA-364-17.

5.4.7.2TestingshouldbeperformedperMethodA,usingtable9forreference.

5.4.7.3SampleSize–Dependentuponcurrenttestgroup,refertosection5.2forspecificsamplesizes.

5.4.7.4Temperatureandduration-105Cfor300hrs.

5.4.8VibrationEIA-364-28

5.4.8.1TheintentofthistestisencompassedinthelatestversionofEIA-364-28.

5.4.8.2Thetestspecimensshallbematedduringthetest.

5.4.8.3SampleSize–Dependentuponcurrenttestgroup,refertosection5.2forspecificsamplesizes.

5.4.8.4TestProcedure–TestconditionVII,testconditionletterD.

5.4.8.5Mounting–Toeliminaterelativemotionbetweenthecontacts,bothmatinghalvesshouldberigidlyfixed.

5.4.8.6Duration–1hourperaxis/3axis.

5.4.8.7Failurecriteria-Noevidenceofphysicaldamage.Nointerruptions>

1.0msec.

5.4.9MixedFlowingGasEIA-364-65

5.4.9.1TheintentofthistestisencompassedinthelatestversionofEIA-364-65.

5.4.9.2SampleSize–Dependentuponcurrenttestgroup,refertosection5.2forspecificsamplesizes.

5.4.9.3EnvironmentalClass-IIA.

5.4.9.4Duration–10days.

5.4.9.5Connectorsshouldbematedduringthisportionofthetest.

5.4.10ThermalDisturbance

5.4.10.1Thetestspecimensshallbematedduringthetest.

5.4.10.2SampleSize–Dependentuponcurrenttestgroup,refertosection5.2forspecificsamplesizes.

5.4.10.3TemperatureRange–15C+/-3Cto85C+/-3C

5.4.10.4ThermalRamp–minimumof1Cperminute.

5.4.10.5Dwelltimesshouldinsurethatthecontactsreachtheextremes,nolessthan5minutes.

5.4.10.6Numberofcycles–10.

5.4.10.7Humiditydoesnotneedtobecontrolledduringthisportionofthetest.

5.4.11ThermalCycling

5.4.11.1Thetestspecimensshallbematedduringthetest.

5.4.11.2SampleSize–Dependentuponcurrenttestgroup,refertosection5.2forspecificsamplesizes.

5.4.11.3TemperatureRange–15C+/-3Cto85C+/-3C

5.4.11.4ThermalRamp–minimum1Cperminute.

5.4.11.5Dwelltimesshouldinsurethatthecontactsreachtheextremes,nolessthan5minutes.

5.4.11.6Numberofcycles–500.

5.4.11.7Humiditydoesnotneedtobecontrolledduringthisportionofthetest.

5.4.12DustEIA-364-91

5.4.12.1TheintentofthistestisencompassedinthelatestversionofEIA-364-91.

5.4.12.2Thetestspecimensshallbeunmatedduringthetest.

5.4.12.3SampleSize–Dependentuponcurrenttestgroup,refertosection5.2forspecificsamplesizes.

5.4.12.4BenignDust