flashmemory测试简介PPT文档格式.ppt
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FloatingGateCharge(Q),p+Substrate,GND,VG=+9.3V,VD=+4.5V,ControlGate,FloatingGate,Source,Drain,Logicstate“0”,FlashCellOperation-EraseModeNegativeGate-FNTunneling,p+Substrate,ControlGate,e-,e-,e-,e-,e-,e-,e-,e-,e-,e-,e-,e-,e-,e-,e-,Electrically-erasablechargefromgate,Source,Drain,Logicstate“1”,FlashMemoryBitThresholdVoltages,FlashArrayArchitecture(schematic),Corememory(core),FlashArrayCellAddressing,RowDecoder,ColumnDecoder,SourceSwitch,BasicMemoryDeviceInternalArchitecture,1,1,1,1,0,0,0,0,0,0,0,0,0,0,0,0,A0,A1,A2,A3,A4,A5,A6,A7,Memorycell,MemoryCellblock:
每个CELL存储data(1/0)AddressDecoderCircuitry:
地址译码以(A0)来选择不同的memorycellorblock进行读写操作。
Input/OutputI/O)circuitry:
是memoryCell和外界的输入输出接口,将data在(D0)与Cell间传输。
ControlCircuitry:
控制memoryCell工作状态的电路CE/OE/WE(ChipEnable/OutputEnable/WriteEnable),Unit2:
DeviceTestingDCparametrictestACparametrictestFunctionalTest,DCparametrictest,ISVM:
ForcecurrentmessagevoltageVSIM:
Forcevoltagemessagecurrent,DCParametricTests:
测试AddressDecoder和I/O回路中Input/OutputBuffer的DC特性。
在DCTest中一般使用VSIM及ISVM的方法。
DCContactCheck开路/短路测试OPEN/SHORTInput/OutputLeakageCheck输入/输出漏电流测试INLEAK/OUTLEAKCMOSAutomaticSleepCMOS自动睡眠模式电流测试CMOSASMStandbyCurrentCheckDevice不工作时待机电流测试ICCSBOutputDriveVoltage&
CurrentDevice电压及电流驱动能力测试VOH/VOL,DCParametricTestOPEN/SHORTestINLEAK/OUTLEAKTestCMOSASMICCSBTestVOH/VOLTest,OpenTest,Purpose:
测量devicepins是否correctlytoDUT/Testerchannel测量Device内部管脚是否有开路。
Groundallpins(includingVCC);
SetVoltageClamp3.0volts;
UsingPMU,forcepositiveornegativecurrent,onepinatatime;
Measureresultantvoltage;
Failstest(open)iftheabsolutevoltagemeasuredisgreaterthan1.5V;
TestMethod,ShortTest,Purpose:
测试thedevicepins是否有短路TestMethod:
UsingPMU,forcepositiveornegativeVoltage,onepinatatime;
Measureresultantcurrent;
Failstest(short)iftheabsolutevoltagemeasuredislessthan0.2V.,Definition,IIL-InputleakagelowThecurrentinaninputwhenitisforcedlowvoltage.,IIH-InputleakagehighThecurrentinaninputwhenitisforcedhighvoltage.,Whytest?
TheIILtestmeasurestheresistancefromaninputpintoVCC,IIHtestmeasurestheresistancefromaninputpintoVSS.Thetestinsuresthattheinputbuffersofferahighresistancewhenapply0vandVCC.,InputLeakageTest(INLEAK),InputLeakageLowTest-IIL,TestMethod,ApplyVCCmax.Preconditioningallinputstologic