专业英语阅读材料.docx
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专业英语阅读材料
Content
Session1IntroductiontoSemiconductor1
1.1Whatissemiconductor?
1
1.2Classificationofsemiconductors3
Readingmaterials4
Session2CrystalStructure10
2.1PrimitiveCellandCrystalPlane10
2.2AtomicBonding12
Readingmaterials14
Session3BandModel21
3.1IntroductiontoQuantumMechanics21
3.2Band22
ReadingMaterials23
Session4TheSemiconductorinEquilibrium27
4.1ChargeCarriersinSemiconductors27
4.2IntrinsicSemiconductor30
4.3ExtrinsicSemiconductors31
Readingmaterials34
Session5CarrierTransport38
5.1Overviewofcarriertransport38
5.2Lowfieldtransport40
5.3Highfieldtransport42
5.4Diffusioncurrent43
Sesison6NonequilibriumExcessCarriersinSemiconductor48
6.1Recombination48
6.2MinorityCarrierLifetime50
6.3AmbipolarTransport52
ReadingMaterials53
Session7ThepnJunction(I)55
7.1Introduction55
7.2BasicStructureofthepnJunction55
7.3EnergybandsforapnJunction56
7.4IdealCurrent-VoltageRelationship57
7.5Characteristicsofapracticaldiode58
Readingmaterials59
Session8ThepnJunction(II)63
8.1Breakdowninpnjunction63
8.2JunctionCapacitance64
8.3Diffusionorstoragecapacitance65
8.4Diodetransients67
8.5Circuitmodelsforjunctiondiodes67
Readingmaterials68
Session9Metal-SemiconductorContacts72
9.1Schottkycontacts72
9.2Ohmiccontacts78
ReadingMaterials81
Session10Heterojunctions84
10.1StrainandStressatHeterointerfaces84
10.2HeterojunctionMaterials85
10.3Energy-BandDiagrams88
ReadingMaterials89
Session11TheBipolarJunctionTransistor(I)93
11.1TheBipolarJunctionTransistorConstruction93
11.2Transistoraction93
11.3Nonidealeffects95
11.4BaseResistance97
Readingmaterials98
Session12TheBipolarJunctionTransistor(II)102
12.1BreakdownVoltage102
12.2FrequencyLimitsofBJT103
12.3TheSchottky-ClampedTransistor104
12.4Small-signalTransistorModel105
Readingmaterials107
Session13BasicsofMOSFETs111
13.1Introduction111
13.2GeneralCharacteristicsofaMOSFET111
13.3MOSsystem112
13.4WorkFunctionDifferences113
13.5Flat-BandVoltage114
13.6Thresholdvoltage115
ReadingMaterials115
Session14NonidealeffectsofMOSFETs119
14.1Introduction119
14.2Effectivemobility119
14.3Velocitysaturation120
14.4Channel-lengthmodulation120
14.5DIBL121
14.6Hot-carriereffect122
14.7GIDL123
Readingmaterials123
Session15AdvancedMOSFETDevices128
15.1Introduction128
15.2ChannelDopingProfile128
15.3GateStack129
15.4Source/DrainDesign129
15.5Schottky-BarrierSource/Drain130
15.6RaisedSource/Drain131
15.7SOI132
15.8ThreeDimensionalstructure133
Readingmaterials133
Session5CarrierTransport
5.1Overviewofcarriertransport
Electronicdevicesrelyontransportofelectrons(holes)inmaterials.Thistransportoccurseitherundertheinfluenceofanelectricfieldorcarrierconcentrationgradients.Thechargesinasolidcanbelooselyclassifiedasfixedandmobile.1Whenanexternalperturbationisapplied(e.g.,anelectricfield)themobilechargescanmovefromonepointinspacetoanother.Inparticulartheycanmovefromonecontactonadevicetoanother.Thefixedcharge,however,canonlybedisturbedslightlyfromitsequilibriumposition,butcannotmoveoverthelengthofadevice.2AsshowninFig.5.1bothfixedchargesandmobilechargesplayanimportantroleinthephysicsofsemiconductors.Essentiallyallelectronicdevicessuchasfieldeffecttransistors,bipolartransistors,diodes,aswellasoptoelectronicdevices,suchaslasersanddetectorsdependuponfreeormobilecharges.3Mobilechargesaretheelectronsintheconductionbandandholesinthevalencebandforsemiconductorsandinsulators.Aswehavediscussedinthepreviouschapter,inmetalsthemobilechargesaretheelectronsintheconductionband.
Fig.5.1Anoverviewoffixedandmobilechargesinsolidsandtheirimpactonphysicalphenomena.Semiconductordevicesaredependentuponmobileelectronsandholes.
Beforediscussingissuesinfreecarrier(ormobilecarrier)transportweremindthereaderofthenatureofelectronicstatesinsolidsinFig.5.2.Inthecaseoftheperfectcrystalweseethatintheconductionandvalencebandstheelectronicstatesare“free”.Therearenoallowedenergylevelsinthebandgap(densityofstatesiszerointhebandgap,asshown).Inthecaseofacrystalwithdefectswestillhavethefreestatesintheconductionandthevalencebands,butwealsohavedefect-relatedallowedstatesinthebandgapregion,asshowninFig.5.2b.Inthesestates(trapstates)electronsarenotfreetomove.
Wewillfirstprovideasimpleoverviewofhowelectronsrespondtoappliedelectricfields.InFig.5.3weshowaschematicofhowelectrons(holes)movethroughasamplewhenanelectricfieldisapplied.InFig.5.3aweshowthesituationinagood-qualitycrystallinematerial.Theelectronmovesundertheelectricfieldforce,butsuffersanumberofscatteringprocesses.Thescatteringoccursduetovariousimperfections,suchasdefectsandvibrationsofatoms(duetothermalenergy).Therelationbetweentheelectronvelocityordistancetraveledandappliedfieldiscomplex.Howeveratlowfieldstherelationcanbedescribedbyasimplerelation.IfweexaminethedistanceversustimetrajectoryofatypicalelectronweobservethattheelectronshowsapathasshowninFig.5.3.Onaveragetheelectrontrajectoryisdescribedby
(5.1)
wheredisthedistancetraveledintimet.Thevelocityvisproportionaltotheelectricfieldappliedthroughμ,themobility.Whentheelectricfieldislargetherelationshipbetweenvelocityandappliedfieldisnotsosimpleandwillbediscussedlater.
(a)
(b)
Fig.5.2Aschematicofthenatureofelectronicstatesinsolids:
(a)foraperfectcrystal,
(b)foracrystalwithdefects.
Fig.5.3Atypicalelectrontrajectoryinasampleandthedistanceversustimeprofile.
5.2Lowfieldtransport
Firstweconsidersmallelectricfields.Inthelow-fieldregimethevelocityisproportionaltotheelectricfield.
5.2.1Mobility
Themobilityisdefined(scalarterms)as
(5.2)
Bydefinition,itisanegativenumberforelectronsandpositiveforholes.4However,thenumericalvalueisusuallygivenasapositivenumberforbothcarriertypes.Inanintrinsicsemiconductorthemobilityisdeterminedbyscatteringwithphonons.Furtherscatteringisintroducedbyimpurities,defectsoralloydisorder.Theconductivityis
(5.3)
Asaunit,usually
isused.WhileCuatroomtemperaturehasamobilityof35
semiconductorscanhavemuchhighervalues.Intwo-dimensionalelectrongases,themobilitycanreachseveral107
atlowtemperature.Inbulksemiconductorswithsmallbandgap,ahighelectronmobilityiscausedbyitssmalleffectivemass.SometypicalvaluesaregiveninTable5.1.
Table5.1.Mobilities(in
)forelectronsandholesatroomtemperatureforvarioussemiconductors
5.2.2MicroscopicScatteringProcesses
Therearetwocollisionorscatteringmechanismsthatdominateinasemiconductorandaffectthecarriermobility:
phononorlatticescattering,andionizedimpurityscattering.
Theatomsinasemiconductorcrystalhaveacertainamountofthermalenergyattemperaturesaboveabsolutezerothatcausestheatomstorandomlyvibrateabouttheirlatticepositionwithinthecrystal.Thelatticevibrationscauseadisruptionintheperfectperiodicpotentialfunction.Aperfectperiodicpotentialinasolidallowselectronstomoveunimpeded,orwithnoscattering,throughthecrystal.Butthethermalvibrationscauseadisruptionofthepotentialfunction,resultinginaninteractionbetweentheelectronsorholesandthevibratinglatticeatoms.Thislatticescatteringisalsoreferredtoasphononscattering.
Latticescatteringisrelatedtothethermalmotionofatoms,therateatwhichthescatteringoccursisafunctionoftemperature.5IfwedenoteμLasthemobilitythatwouldbeobservedifonlylatticescatteringexisted,thenthescatteringtheorystatesthattofirstorder6
(5.4)
Mobilitythatisduetolatticescatteringincreasesasthetemperaturedecreases.Intuitively,weexpectthelatticevibrationstodecreaseasthetemperaturedecreases,whichimpliesthattheprobabilityofascatteringeventalsodecreases,thusincreasingmobility.
Fig.5.4showsthetemperaturedependenceofelectronandholemobilitiesinsilicon.Inlightlydopedsemiconductors,latticescatteringdominatesandthecarriermobilitydecreaseswithtemperatureaswehavediscussed.ThetemperaturedependenceofmobilityisproportionaltoT-n.Theinsertsinthefigureshowthattheparameternisnotequalto3/2asthefirst-orderscatteringtheorypredicted.However,mobilitydoesincreaseasthetemperaturedecreases.
(a)(b)
Fig.5.4(a)Electronand(b)holemobilityinsiliconversustemperatureforvariousdopingconcentration
Thesecondinteractionmechanismaffectingcarriermobilityiscalledionizedimpurityscattering.Wehaveseenthatimpurityatomsareaddedtothesemiconductortocontroloralteritscharacteristics.Theseimpuritiesareionizedatroomtemperaturesothatacoulombinteractionexistsbetweentheelectronsorholesandtheionizedimpurities.Thiscoulombinteractionproducesscatteringorcollisionsandalsoaltersthevelocitycharacteristicsofthechargecarrier.IfwedenoteμIasthemobilitythatwouldbeobservedifonlyionizedimpurityscatteringexisted,thentofirstorderwehave
(5.5)
where
isthetotalionizedimpurityconcentrationinthesemiconductor.Iftemperatur