at89c51单片机外文资料.docx

at89c51单片机外文资料.docx

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at89c51单片机外文资料

AT89C51的介绍

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ThedeviceismanufacturedusingAtmel’shigh-densitynonvolatilememorytechnologyandiscompatiblewiththeindustry-standardMCS-51instructionsetandpinout.Theon-chipFlashallowstheprogrammemorytobereprogrammedin-systemorbyaconventionalnonvolatilememoryprogrammer.Bycombiningaversatile8-bitCPUwithFlashonamonolithicchip,theAtmelAT89C51isapowerfulmicrocomputerwhichprovidesahighly-flexibleandcost-effectivesolutiontomanyembeddedcontrolapplications.

Functioncharacteristic

TheAT89C51providesthefollowingstandardfeatures:

4KbytesofFlash,128bytesofRAM,32I/Olines,two16-bittimer/counters,afivevectortwo-levelinterruptarchitecture,afullduplexserialport,on-chiposcillatorandclockcircuitry.Inaddition,theAT89C51isdesignedwithstaticlogicforoperationdowntozerofrequencyandsupportstwosoftwareselectablepowersavingmodes.TheIdleModestopstheCPUwhileallowingtheRAM,timer/counters,serialportandinterruptsystemtocontinuefunctioning.ThePower-downModesavestheRAMcontentsbutfreezestheoscillatordisablingallotherchipfunctionsuntilthenexthardwarereset.

PinDescription

VCC：

Supplyvoltage.

GND：

Ground.

Port0：

Port0isan8-bitopen-drainbi-directionalI/Oport.Asanoutputport,eachpincansinkeightTTLinputs.When1sarewrittentoport0pins,thepinscanbeusedashighimpedance0mayalsobeconfiguredtobethemultiplexedloworderaddress/databusduringaccessestoexternalprogramanddatamemory.InthismodeP0hasinternal0alsoreceivesthecodebytesduringFlashprogramming,andoutputsthecodebytesduringprogramverification.Externalpullupsarerequiredduringprogramverification.

Port1

Port1isan8-bitbi-directionalI/OportwithinternalPort1outputbufferscansink/sourcefourTTL1sarewrittentoPort1pinstheyarepulledhighbytheinternalpullupsandcanbeusedasinputs.Asinputs,Port1pinsthatareexternallybeingpulledlowwillsourcecurrent（IIL）becauseoftheinternal1alsoreceivesthelow-orderaddressbytesduringFlashprogrammingandverification.

Port2

Port2isan8-bitbi-directionalI/OportwithinternalPort2outputbufferscansink/sourcefourTTL1sarewrittentoPort2pinstheyarepulledhighbytheinternalpullupsandcanbeusedasinputs.Asinputs,Port2pinsthatareexternallybeingpulledlowwillsourcecurrent,becauseoftheinternal2emitsthehigh-orderaddressbyteduringfetchesfromexternalprogrammemoryandduringaccessestoexternaldatamemorythatuse16-bitaddresses.Inthisapplication,itusesstronginternalpullupswhenemitting1s.Duringaccessestoexternaldatamemorythatuse8-bitaddresses,Port2emitsthecontentsoftheP2SpecialFunction2alsoreceivesthehigh-orderaddressbitsandsomecontrolsignalsduringFlashprogrammingandverification.

Port3

Port3isan8-bitbi-directionalI/OportwithinternalPort3outputbufferscansink/sourcefourTTL1sarewrittentoPort3pinstheyarepulledhighbytheinternalpullupsandcanbeusedasinputs.Asinputs,Port3pinsthatareexternallybeingpulledlowwillsourcecurrent（IIL）becauseofthe3alsoservesthefunctionsofvariousspecialfeaturesoftheAT89C51aslistedbelow:

Port3alsoreceivessomecontrolsignalsforFlashprogrammingandverification.

RST

Resetinput.Ahighonthispinfortwomachinecycleswhiletheoscillatorisrunningresetsthedevice.

ALE/PROG

AddressLatchEnableoutputpulseforlatchingthelowbyteoftheaddressduringaccessestoexternalmemory.Thispinisalsotheprogrampulseinput（PROG）duringFlashnormaloperationALEisemittedataconstantrateof1/6theoscillatorfrequency,andmaybeusedforexternaltimingorclockingpurposes.Note,however,thatoneALEpulseisskippedduringeachaccesstoexternalDataMemory.

Ifdesired,ALEoperationcanbedisabledbysettingbit0ofSFRlocation8EH.Withthebitset,ALEisactiveonlyduringaMOVXorMOVCinstruction.Otherwise,thepinisweaklypulledhigh.SettingtheALE-disablebithasnoeffectifthemicrocontrollerisinexternalexecutionmode.

PSEN

ProgramStoreEnableisthereadstrobetoexternalprogramtheAT89C51isexecutingcodefromexternalprogrammemory,PSENisactivatedtwiceeachmachinecycle,exceptthattwoPSENactivationsareskippedduringeachaccesstoexternaldatamemory.

EA/VPP

ExternalAccessEnable.EAmustbestrappedtoGNDinordertoenablethedevicetofetchcodefromexternalprogrammemorylocationsstartingat0000HuptoFFFFH.Note,however,thatiflockbit1isprogrammed,EAwillbeinternallylatchedonshouldbestrappedtoVCCforinternalprogrampinalsoreceivesthe12-voltprogrammingenablevoltage（VPP）duringFlashprogramming,forpartsthatrequire12-voltVPP.

XTAL1

Inputtotheinvertingoscillatoramplifierandinputtotheinternalclockoperatingcircuit.

XTAL2

Outputfromtheinvertingoscillatoramplifier.

OscillatorCharacteristics

XTAL1andXTAL2aretheinputandoutput,respectively,ofaninvertingamplifierwhichcanbeconfiguredforuseasanon-chiposcillator,asshowninFigureaquartzcrystalorceramicresonatormaybeused.Todrivethedevicefromanexternalclocksource,XTAL2shouldbeleftunconnectedwhileXTAL1isdrivenasshowninFigurearenorequirementsonthedutycycleoftheexternalclocksignal,sincetheinputtotheinternalclockingcircuitryisthroughadivide-by-twoflip-flop,butminimumandmaximumvoltagehighandlowtimespecificationsmustbeobserved.

Figure1.OscillatorConnectionsFigure2.ExternalClockDriveConfiguration

IdleMode

Inidlemode,theCPUputsitselftosleepwhilealltheonchipperipheralsremainactive.Themodeisinvokedbysoftware.Thecontentoftheon-chipRAMandallthespecialfunctionsregistersremainunchangedduringthismode.Theidlemodecanbeterminatedbyanyenabledinterruptorbyahardwareshouldbenotedthatwhenidleisterminatedbyahardwarereset,thedevicenormallyresumesprogramexecution,fromwhereitleftoff,uptotwomachinecyclesbeforetheinternalresetalgorithmtakescontrol.On-chiphardwareinhibitsaccesstointernalRAMinthisevent,butaccesstotheportpinsisnotinhibited.ToeliminatethepossibilityofanunexpectedwritetoaportpinwhenIdleisterminatedbyreset,theinstructionfollowingtheonethatinvokesIdleshouldnotbeonethatwritestoaportpinortoexternalmemory.

Power-downMode

Inthepower-downmode,theoscillatorisstopped,andtheinstructionthatinvokespower-downisthelastinstructionexecuted.Theon-chipRAMandSpecialFunctionRegistersretaintheirvaluesuntilthepower-downmodeisterminated.Theonlyexitfrompower-downisahardwarereset.ResetredefinestheSFRsbutdoesnotchangetheon-chipRAM.TheresetshouldnotbeactivatedbeforeVCCisrestoredtoitsnormaloperatinglevelandmustbeheldactivelongenoughtoallowtheoscillatortorestartandstabilize.

ProgramMemoryLockBits

Onthechiparethreelockbitswhichcanbeleftunprogrammed（U）orcanbeprogrammed（P）toobtaintheadditionalfeatureslistedinthetablebelow.

Whenlockbit1isprogrammed,thelogiclevelattheEApinissampledandlatchedduringreset.Ifthedeviceispoweredupwithoutareset,thelatchinitializestoarandomvalue,andholdsthatvalueuntilresetisactivated.ItisnecessarythatthelatchedvalueofEAbeinagreementwiththecurrentlogiclevelatthatpininorderforthedevicetofunctionproperly.

Synthesisofan8051-LikeMicro-ControllerToleranttoTransientFaults

Thispaperpresentstheimplementationofafaultdetectionandcorrectiontechniqueusedtodesignarobust8051micro-controllerwithrespecttoaparticulartransientfaultcalledSingleEventUpset（SEU）.AspecificstudyregardingtheeffectsofaSEUinthemicro-controllerbehaviorwasperformed.Furthermore,afaulttoleranttechniquewasimplementedinaversionofthe8051.TheVHDLdescriptionofthefault-tolerantmicroprocessorwasprototypedinaFPGAenvironmentandresultsintermsofareaoverhead,levelofprotectionandperformancepenaltiesarediscussed.

1.Introduction

Theconstantimprovementsachievedinthemicroelectronicstechnologyallowthemanufacturingofverycomplexcircuits,substitutingboardsorevencomputersofthepast80’s.Nowadays,becauseofthemicroelectronicsadvances,traditionalapplicationsbecomecheaperandmorereliable,whilealargerangeofnewapplicationscantakeadvantageofintegrateddevicesbyusingtheso-calledembeddedsystems.Inallcases,architecturesarestronglybasedonsomekindofdataprocessor,suchasamicro-controlleroraDSPprocessingunit,forexample.

Thecontinuousdecreaseinthesemiconductordimensionsandinelectricalfeatures,leadstoanincreasingsensitivitytosomeeffectsoftheenvironment（ionizationduetoradiation,magneticperturbations,thermal,...）consideredminorornegligibleinthetechnologiesofthepast.Particularly,digitalcircuitsoperatinginspacearesubjecttodifferentkindsofradiation.However,someproblemshavealsobeenreportedforsomeEarthapplications,likeavionicssystems.

Radiationeffectscanbepermanentortransient.Permanentfaultsresultfromparticlestrappedatthesilicon/oxideinterfacesandappearonlyafterlongexposuretoradiation（TotalIonizationDose）.Transientfaults（SingleEventEffects,SEE）maybecausedbytheimpact