JESD47I中文版Word文档格式.docx

JESD47I中文版Word文档格式.docx

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IntegratedCircuits

JESD47I

（

RevisionofJESD47H.01,April2011）

JULY2012

JEDECSOLIDSTATETECHNOLOGYASSOCIATION

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JEDECStandardNo.47I

Page23

5.5 Devicequalificationrequirements（cont’d）

STRESSDRIVENQUALIFICATIONOFINTEGRATEDCIRCUITS

（FromJEDECBoardBallot,JCB-12-24,formulatedunderthecognizanceoftheJC14.3SubcommitteeonSiliconDevicesReliabilityQualificationandMonitoring.）

通过JEDEC委员会JCB-12-24号投票，在JC14.3硅晶圆器件可靠性考核和监控小组委员会审理后系统地阐述和制定

1 Scope范围

Thisstandarddescribesabaselinesetofacceptancetestsforuseinqualifyingelectroniccomponentsasnewproducts,aproductfamily,orasproductsinaprocesswhichisbeingchanged.

这个文档描述了用于考核新产品、同族器件或工艺变更的可接受的基准测试标准

Thesetestsarecapableofstimulatingandprecipitatingsemiconductordeviceandpackagingfailures.Theobjectiveistoprecipitatefailuresinanacceleratedmannercomparedtouseconditions.FailureRateprojectionsusuallyrequirelargersamplesizesthanarecalledoutinqualificationtesting.Forguidanceonprojectingfailurerates,refertoJESD85MethodsforCalculatingFailureRatesinUnitsofFITs.Thisqualificationstandardisaimedatagenericqualificationforarangeofuseconditions,butisnotapplicableatextremeuseconditionssuchasmilitaryapplications,automotiveunder-the-hoodapplications,oruncontrolledavionicsenvironments,nordoesitaddress2ndlevelreliabilityconsiderations,whichareaddressedinJEP150.Wherespecificuseconditionsareestablished,qualificationtestingtailoredtomeetthosespecificrequirementscanbedeveloped,usingJESD94thatwillresultinabetteroptimizationofresources.

这些测试用于加速和诱发半导体器件和封装的失效。

目的是通过比使用环境相比加速的方式来促成失效。

相比考核测试，失效率的预测需要更多的样品数量。

如果需要计算预期的失效率，请参考JESD85MethodsforCalculatingFailureRatesinUnitsofFITs。

本考核标准用于制定一系列适用于一般使用环境下的通用考核标准，而不是用于例如军工应用，汽车电子，或者不受控的航天电子等极端使用环境；

同时本标准也不解决JEP150标准中提出的2nd等级可靠性问题。

在确定具体使用条件的情况下，可以使用JESD94开发适合于满足这些特定要求的考核测试，从而更好地优化测试资源。

Thissetoftestsshouldnotbeusedindiscriminately.Eachqualificationprojectshouldbeexaminedfor:

a）Anypotentialnewanduniquefailuremechanisms.

b）Anysituationswherethesetests/conditionsmayinduceinvalidoroverstressfailures.

注意：

不要不加选择地使用本文档中的测