1、PreshipmentInspection of solar panel ApplusSolar Panel Inspection procedureContentsApplus 1Solar Panel Inspection procedure 11. Object 32. Scope 32.1 Type of panel 33. Relevant standards 43.1 IEC 61215:2005 43.2 IEC 61730:2004 43.3 IEC 62108:2007 43.4 IEEE 1513:2001 43.5 UL 1703:2004 44. Test points
2、 44.1 Certification test: 44.2 Inspection test: 55. Inspection procedure 65.1 Inspection steps 65.2 Sampling 75.3 Accept Criteria 75.4 Visual inspection: 75.5 Flash inspection 135.6 EL inspection 146. Loading 156.1 Checklists 166.2 Loading procedure 161. ObjectThis document intends to describe all t
3、he inspection works related to solar panel quality control services2. ScopeThis document applies to the inspection of crystalline silicon terrestrial photovoltaic (PV) modules for long-term operation in general open-air climates. 2.1 Type of panel Polycrystalline Monocrystalline Amorph3. Relevant st
4、andards3.1 IEC 61215:2005Photovoltaic (PV) modules Design qualification and type approval3.2 IEC 61730:2004Photovoltaic (PV) module safety qualification3.3 IEC 62108:2007Concentrator photovoltaic (CPV) modules and assemblies Design qualification and type approval3.4 IEEE 1513:2001Recommended practic
5、e for qualification of concentrator photovoltaic (PV) receive sections and modules3.5 UL 1703:2004Flat-plate photovoltaic modules and panels4. Test points4.1 Certification test:TestTitleTest conditions4.1.1Visual inspectionSee Detail inspection list in 6.44.1.2Maximum power determinationSince a sola
6、r cell has a wavelength-dependent response, its performance is significantly affected by the spectral distribution of the incident radiation, which in natural sunlight varies with several factors such as location, weather, time of year, time of day, orientation of the receiving surface, etc., and wi
7、th a simulator varies with its type and conditions of use. If the irradiance is measured either with a thermopile-type radiometer (that is not spectrally selective) or with a reference solar cell, the spectral irradiance distribution of the incoming light must be known in order to make the necessary
8、 corrections to obtain the performance of the PV device under the reference solar spectral distribution defined in this standard as specified. It is also possible for a user or array designer, using the spectral response of the cells, to compute within a reasonable tolerance the performance of a PV
9、device when exposed to light of any other known spectral irradiance distribution.4.1.3Insulation testDielectric withstand at 1000 V d.c. + twice the maximum systems voltage for 1 min.For modules with an area of less than 0.1 m2 the insulation resistance shall be not less than 400M. For modules with
10、an area larger than 0.1m2, the measured insulation resistance times the area of the module shall be not less than 40 Mm2 measured at 500V or maximum systems voltage, whichever is greater.4.1.4Measurement of temperature coefficientsDetails see IEC 61215Determine the temperature coefficients of curren
11、t (), voltage () and peak power () from module measurements as specified. The coefficients so determined are valid at the irradiance at which the measurements were made. See evaluation of module temperature coefficients at different irradiance levels. For linear modules, they are also valid over an
12、irradiance range of 30 % of this level.4.1.5Measurement of nominal operating cell temperature(NOCT)Total solar irradiance 800 W m-2Ambient temperature: 20Wind seep: 1 ms-14.1.6Performance at STC and NOCTCell temperature: 25 and NOCTIrradiance: 1000 and 800 Wm-2 with IEC 60904-3 reference solar spect
13、ral irradiance distributions4.1.7Performance at low irradianceCell temperature: 25Irradiance: 200 Wm-2 with IEC 60904-3 reference solar spectral irradiance distribution4.1.8Outdoor exposure test60 kWhm-2 total solar irradiance4.1.9Hot-spot endurance testFive-hour exposure to 1000Wm-2 irradiance in w
14、orst-case hot-spot condition4.1.10UV preconditioning test15kWhm-2 total UV irradiation in the wavelength range from 280 nm to 385 nm with 5 kWhm-2 UV irradiation in the wavelength range from 280 nm to 385 nm4.1.11Thermal cycling test50 to 200 cycles from -40 to +85 with STC peak power current during
15、 200 cycles4.1.12Humidity-freeze test10 cycles from +85,85% RH to -404.1.13Damp-heat test1000h at +85,85% RH4.1.14Robustness of terminations testSee details in IEC 60068-2-214.1.15Wet leakage current testFor modules with an area of less than 0.1m2 the insulation resistance shall be not less than 400
16、M.For modules with an area larger than 0.1m2 the measure insulation resistance times the area of module shall be not less 40 Mm2 to be measured at 500V or maximum system voltage, whichever is greater4.1.16Mechanical load test3 cycles of 2400 Pa uniform load, applied for 1 h to front and back surface
17、s in turn.Optional snow load of 5400 Pa during last front cycle4.1.17Hail test25mm diameter ice ball at 23ms-1, directed at 11 impact locations4.1.18Bypass diode thermal testOne houre at ISC and 75One hour at 1.25 times ISC and 754.2 Inspection test:4.2.1 Visual inspectionPurpose:Detect any visual d
18、efects in the module.Major visual defects:1. Verifying all the elements and the installation2. Broken, cracked, or torn external surfaces, including superstrates, frames and junction boxes3. Bent or misaligned external surfaces, including superstrates, substrates, frames and junction boxes to the ex
19、tent that the installation and/or operation of the module would be impaired4. A crack in a cell the propagation of which could remove more than 10% of that cells area from the electrical circuit of the module5. Bubbles or delaminations forming a continuous path between any part of the electrical cir
20、cuit and the edge of the module6. Loss of mechanical integrity, to the extent that the installation and/or operation of the module would be impaired.4.2.2 Flash testPurpose:To confirm the PV panels reliability and the veracity of the flash data report given by from the factory.Equipment:1. A radiant
21、 source machine (natural sunlight or a solar simulator class B or better calibrated in accordance with IEC 60904-9)2. A PV reference module (calibrated in accordance with IEC 60904-2 or IEC 60904-6)3. A temperature detector (calibrated by local lab) which an accuracy of 1 and repeatability of 0.54.2
22、.3 EL testPurpose:Detect any invisible defects in the module, test specially aimed to detect hidden cracks in the silicon cellsEquipment:EL RX machine5. Inspection procedure6.1 Inspection stepsNo.Inspection itemsCommentsPicture1Check the flash reportFlash report is a test report given by factory 2Ch
23、eck packing solutionConfirm the packing solution is according to the specification and in good condition3SamplingSelect the quantity of inspection product4Visual inspectionDetect any visual defects in the module5Dimension inspectionConfirm the module is according to the specification6EL inspectionDe
24、tect any invisible defects in the module7Power inspectionPower inspection is taken by a flash equipment and shows the performance of product8Loading supervisingInsure the product properly stored before shipping9Inspection picturesThe records and the traceability of inspection work10Record unqualifie
25、d modules numberReject product control6.2 SamplingAccording to AQL (Acceptance Quality Limit) & standard of contact & client agreements randomly take samples from each path.6.3 Accept CriteriaAccording to AQL & client requirements6.4 Visual inspection:ProcedureCarefully inspect each module under an
26、illumination of not less than 1000 lux for the following conditions:a) Cracked, bent, misaligned or torn external surfaces b) Broken cells c) Cracked cells d) Faulty interconnections or joints e) Cells touching one another or the framef) Failure of adhesive bondsg) Bubbles or delaminations forming a
27、 continuous path between a cell and the edge of the moduleh) Tacky surfaces of plastic materialsi) Faulty terminations, exposed live electrical partsj) Any other conditions which may affect performance Basic requirements (Detail requirement according the contact and client agreements)Description1.Ch
28、ipped cell (No more than two (2) chipped cells per module)2.Chipped cell (Max. Total missed surface 0.5 cm2)3.Cell impurities (Foreign conducting particles; Area 4 mm allowed)4.Cell impurities (Foreign non-conducting particles; Area 10 mm dia. allowed)5Bubbles (Area 5 cm allowed per. sq. meter of mo
29、dule)6Gap between cells (Adjusted in Stringing machine)7Gap between cells (Gap 1.0 mm)8Ribbon misalignment ( 1 mm allowed)9Ribbon misalignment (The ribbons on each cell are not allowed to touch each other, and connection should not be closer to the cell edge than the last gridline)10Broken cells (No
30、t admitted)11Cracked cells (Not admitted)12Space between cells and frame edge (Cell to frame 8 4 mm / Not accepted if less than 4mm)13Scratches on glass (No serious scratches or damaged glass allowed)14Scratches on glass (Length 60mm, width 0.1mm, not allowed)15Scratches on glass (Length =60mm, widt
31、h =0.1mm, only 1 per square meter is allowed)16Ribbons (Broken leads not admitted)17Label (Missing bar code)18Label (front label Covering cell)19Frame scratches (Scratch longer than 30 mm is not allowed)20Frame assembly (Frame corner Gap on front side; Gap 1 mm not allowed.)21Frame dimensions (According to module datasheet)22Frame adhesive tape (Remains after proper cutting with knife allowed.)B
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