MILSTD202G Method 310中文版.docx

1、MILSTD202G Method 310中文版MIL-STD-202G METHOD 310 CONTACT-CHATTER MONITORING接點抖動監測1. PURPOSE. This test is conducted for the purpose of detecting contact-chatter in electrical and electronic component parts having movable electrical contacts, such as relays, switches, circuit breakers, etc., where it

2、is required that the contacts do not open or close momentarily, as applicable, for longer than a specified time-duration (see 4.3) under environmental test conditions, such as vibration, shock, or acceleration. This test method provides standard test procedures for monitoring such opening of closed

3、contacts or closing of open contacts.1.目的:這測試執行確定在電器和電子零件部份有作切換電器接觸時的接點抖動目的,如繼電器,開關,電流斷路器,等。接觸的地方不能有短暫的斷開或導通。如適用的環境試驗條件下,特定的持續長時間期間(見4.3),如:振動,衝擊或加速。這檢驗方法提供標準測試程序對於監測如”閉合接點打開”或 ”打開接點閉合”兩種測試電路。2. TEST CIRCUITS.2.測試電路2.1 Selection. In this method there are two test-circuits: A (see 3.1), and B (see 3.

4、2). The selection of the test-circuit depends largely upon the type of electrical contacts to be tested. Test-circuit B is preferred, whenever possible, to avoid contact contamination caused by the formation of carbonaceous deposits on the contacts. The individual specification shall specify the tes

5、t-circuit and time-duration (see 4.3) required in connection with monitoring of shock and vibration tests. The test-circuits listed herein are recommended reference circuits. Any comparable test-circuit which meets the test requirements and the calibration procedures as stated herein , may be used f

6、or this test.2.1選擇.這方法有兩個測試電路:A(見3.1),和B(見3.2)。測試電路的選擇取決於主要根據電氣接觸的類型來做測試。測試電路B是首選的, 盡可能, 以避免接觸形成的積炭造成的接觸污染。特定規格應註明衝擊的監測和震動測試時測試電路和持續時間的要求。呈列於此的測試電路為建議的參考電路。任何類似的測試電路都應符合本文中指定的測試要求和校正程序,才能被用作使用測試。2.1.1 Selection of test-circuit A. Test-circuit A is for monitoring test-specimens with a single set of c

7、ontacts, for the opening of normally-closed contacts or false closures of normally- opened contacts (see figure 310-1). Test-circuit A should not be specified for specimens whose capability includes low-level or dry-circuit ratings (10 milliamperes or less and 2 volts or less for openings or closing

8、s less than 10 microseconds); since the current through the electrical contacts under test from the test-circuit may cause arcing, thus damaging the contacts.2.1.1 測試電路A的選擇。測試電路A是對於監測樣品-單一組連接設定,如正常導通接觸的 斷開或正常切斷接觸時不正確的導通(見圖310-1)。測試電路A不應指定測試樣品其 功能包含低等級或微電路等級(10mA或更低和2V或切斷時間或導通時間比10s更低 )；因為在測試情況下從測試電路

9、電流穿過電子觸點可能造成電弧,從而損壞接觸 觸點。2.1.2 Selection of test-circuit B. Test-circuit B is for monitoring test-specimens with a single set of contacts, for the opening of normally-closed contacts and false closures of normally- open contacts (see figure 310-3). Test-circuit B should not be used for openings or c

10、losings of less than 10 microseconds. Test-circuit B does not allow current in excess of 20 milliamperes or an open-circuit voltage in excess of 2-volts during monitoring; which insures that there will be no arcing, which will cause damage, to low-level and dry-circuit test specimens.2.1.2 選擇測試電路B。測

11、試電路B是對於監控測試樣品-一組接點設定,如正常導通接觸 的斷開或正常切斷接觸時不正確的導通(見圖310-3)。測試電路B不應使用於切斷或 導通時間低於10s的開關。測試電路B不允許測試電流超過20 m A或 或在監測期間 開路電壓超過2V; 在測試低等級和微電流的樣品期間,應保證樣品沒有電弧和造成損害 發生。 註: A-低於切換時間10s ,B-不應低於切斷或導通時間低於10s。3. TEST SYSTEMS.3.測試系統3.1 Test-circuit A. The test circuit shall be the thyratron circuit shown on figure 31

12、0-1 or an approved equivalent circuit. The values for R1, C1, and the suppressor grid-cathode voltage, controlled by R7, principally controls the firing of the thyratron and are so chosen that the thyratron will fire when the duration of the contact-opening exceeds the time-duration specified in the

13、 individual specification (see 4.3 and 5). For the longer time-durations, such as above 1 millisecond, it may be necessary to change the values of R2, R5, and R6.3.1測試電路A。測試電路應如圖310-1所示的閘流管電路或適當等效電路。R1,C1和抑制 柵極電壓值由R7來作控制,主要是在控制閘流管的觸發和當接觸斷開超過在特定規 格指定的時間期間,閘流管將改變觸發(見4.3章和5章)。對於較長的持續時間,如1ms 以上,它需要改變R2,

14、R5和R6的阻值。a. To monitor normally-closed contacts, the normally-closed contacts are connected to BP1 and BP2, with switch S1 in the normally-closed position. The grid of the thyratron is placed at ground potential. The cathode of the thyratron is at a positive potential (depending on the setting of R7

15、), thus providing sufficient negative bias to cut the thyratron off. Any contact chatter (opening of closed contacts) will cause the grid of the thyratron to rise exponentially to +150 volts at a rate determined by the preselected time constant of R1 and C1. As long as the contacts remain open, the

16、grid potential will continue to rise. If the contacts remain open for longer than the specified interval, the grid potential rises to the point at which the thyratron conducts and ionizes, thus lighting DS1. Since, in a thyratron, the grid loses control of conduction as soon as the tube conducts, th

17、e contacts being monitored can reclose at any time thereafter without affecting the monitoring circuit. Thus, lamp DS1 will remain on until the thyratron is manually reset by operation of switch S2.a.監測正常導通接觸,正常導通位置應是正常導通接點連接到BP1和BP2和Switch S1。閘流 管的柵極因放置於接地位置。而閘流管(SCR)的陰極(cathode)正確電位(取決在R7的設定), 從而提

18、供了充足的負偏差,以切斷閘流管的為”切斷”。任何的接觸抖動(導通接觸點的 斷開)將造成閘流管的柵極, 透過預選的R1和C1的時間常數決定的速率成倍上升到+150 V。只要接觸保持斷開，柵極電位將繼續上升。如果觸點繼續斷開大於指定的時間間隔,柵極電位將爬升點到閘流管傳導和電離,從而點燃DS1。至從在閘流量管的柵極失去傳導控制立刻由管做傳導，被監視的接觸，可以在任何重合閘,此後的時間不影響監控電路。因此，DS1的燈泡將保持“導通”直到閘流管手動重新設置開關S2的操作。b. To monitor normally-open contacts for false closures, it is nec

19、essary to operate switch S1 to the normally-open position, so that the connection between the +150 volts and the time- constant charging circuit is open. When open contacts are connected to BP1 and BP2 and the connection is made, these contacts close. At contact closure, voltage is applied to the ch

20、arging circuit, starting a build-up in the same manner as described in (a) for normally- closed contacts. At the conclusion of the test, if lamp DS1 is off, then there has been a no- chatter interval exceeding the specified duration; if the lamp is on, then there was at least one-interval when the s

21、pecified time-duration was exceeded. After an indication of failure, the thyratron circuit shall be restarted by operation of switch S2.b.對於監測正常斷開接觸時不正確的導通,它是需要操作開關S1到常開位置, 這樣的連接 介於150V和時間常數充電電路是斷開之間。當斷開觸點連接到BP1和BP2和連接之後, 那些連接觸點將”導通”。在接觸導通時, 電壓是適用於充電電路, 以同樣的方式開始建 立描述為正常閉觸點。在測試結速之後,如果燈DS1是關閉,之後它會有一個非

22、抖動時 間間隔超過特定時間間隔;如果燈是”斷開”,當特定時間持續時間超過時它至少有一 個時間間隔。故障指示後,閘流管電路開關S2的操作應重新啟動。3.1.1 Calibration procedure for test-circuit A. The calibration-circuit shown on figure 310-2 may be used to calibrate the monitoring-circuit shown on figure 310-1 by using the following procedure:3.1.1 測試電路A-校正程序。如圖310-2所示的校正電

23、路能被用於校正監測電路如圖310-1 所示，通過使用以下步驟：a. Make the proper connections of the monitoring-circuit to the calibration-circuit as shown, and set switch S1 to position A.a. 設為監控電路的正確連接校準電路如圖所示，設置開關S1位置A。b. Calibrate the oscilloscope triggering input as follows:b. 校正示波器觸發輸入如以下:(1) Set switch S4 to position A, so

24、that the trigger input is connected to the Y-axis input of the oscilloscope.(1)設定開關S4至位置A,所以觸發輸入是連接到示波器Y軸輸入。(2) Set the time-base control of the oscilloscope for approximately 20-percent of the time- duration for which the calibration is being made.(2)設定示波器的時間基準控制大約為校正設定的持續時間20%。(3) Set the Y-amplit

25、ude of the oscilloscope for 1-volt per centimeter.(3) 示波器的Y-振幅為1V/cm。(4) Set the triggering coupling to ac sensitivity.(4) 設定觸發偶合至AC感應。(5) Open the switch S3 and adjust the triggering level and stability control so that the trace on The oscilloscope will trigger at 0.5-volt or less. The closer the t

26、rigger-level is to zero, the greater the accuracy of calibration.(5) 打開開關S3和調整觸發水平和穩定的控制，以便示波器軌跡將觸發在0.5V或以下。 當觸發水平越接近0，其校正的精度須越大。c. Set switch S4 to position B, so that the Y-axis input of the oscilloscope is connected through capacitor C4 to the plate of the thyratron in the test circuit. C.設定開關S4至

27、位置B,其示波器的Y軸是在測試電路中是透過電容C4到閘流管的陽極作 連接。d. Close switch S3.d.關閉開關s3。e. Set the Y-amplitude of the oscilloscope for a usable display, and the time-base as in preceding (b) (2).e.對於可用的顯示範圍設定示波器的Y-振幅,和時間基準如前面(b)的第(2)。f. Depress monitor-circuit reset switch S2 of figure 310-1 to set the circuit in the read

28、y position, i.e., with the circuit being calibrated and lamp DS1 extinguished.f.減少監控電路重新設定圖310-1的開關S2去設定電路到”準備”位置, 即校準電路和燈DS1 的熄滅。g. Open switch S3; the observed trace of the oscilloscope should move across the screen at a positive amplitude until it is deflected downward by the negative pulse creat

29、ed when the thyratron fires. The time interval between the start of the trace and the negative pulse is the detection time. Adjust R7 of figure 310-1 to the time-duration specified in the individual specification.g.打開開關S3:觀察示波器軌跡應橫相移動在正極振幅直到閘流管點燃陰極脈衝產生偏移下 降。軌跡的開始和負脈衝之間的時間間隔是檢測時間。調整圖310-1的R7至持續時間規 定在

30、特定規格內。 ( 圖表 310-1)Resistors Capacitors R1 - 35K 1/2W, 1% (see note 1) C1 - .0022F, 600 VDCW (see note 1)R2 - 27K 1/2W, 5%R3 - 47K 1W, 5% R4 - 200K 1/2W, 5%R5 - 70K 1W, 5% R6 - 2.4K 1W, 5% R7 - 5K 1W R8 - 500 1/2W, 5% MiscellaneousDS1 - NE-51S1 DPDTS2 - SPSTNC 125V 1 amp (push)V1 - JAN-5727/2D21WNOTE

31、S:(註)1. These values are to be chosen to obtain the desired time-duration for the applicable test condition (see 4.3).These particular values are applicable to 10 microseconds time-duration only.1. 對於適合測試條件(見4.3)這些值是被挑選而獲得想要的持續時間。那些特定的值緊適用 於10S的持續時間。 FIGURE 310-1. Test-circuit A; monitor circuit for contact-opening and closing. 圖310-1。測試電路A;接點斷開和導通的監測電路。 ( 圖表 310-2)NOTE: The oscilloscope shall have an accuracy of 3 percent or better on time base and have provision for external triggering.註:示波器應有3%的精確度或好的時間基準和有外部觸發的提供。 FIGURE 310-2. Calibration circuit for test-circuit A. 圖310-2。測試電路A的